Bulk nanocrystalline superconducting YBa2Cu3O7-x
نویسندگان
چکیده
منابع مشابه
Effect of Sintering Conditions on Microstructure and the Superconducting Properties of YBa2Cu3O7 x
YBa2Cu3O7-X tapes fabricated from precursor powder, were used to investigate the effect of sintering conditions on the microstructure. The sintering experiments were carried out in oxygen over the temperature range of 915-950ْC. Scanning electron microscopy was used to examine the sintered products. The result indicated a significant increase in densification and grain growth when the tapes were...
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YBCO thin films have been grown by Metal Organic Chemical Vapour Deposition in ;I cold wall type reactor. The 0-diketonates of yttrium, barium and copper are used as precursors. Filrna have bcen deposited on (001 I MgO and (012) LaA103 single crystalline substrates. The morphology is very dependant on thc gas p h a x composition. Different oxygen partial pressures have been investigated. An inc...
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متن کاملOBSERVATION OF NONUNIFORM CURRENT TRANSPORT IN EPITAXIAL YBa2Cu3O7– x FILM NEAR THE SUPERCONDUCTING TRANSITION TEMPERATURE
We have studied the local transport properties in an epitaxial YBa2Cu3O7 x (YBCO) film on LaAlO3 (LAO) using variable temperature scanning laser microscope (VTSLM) near the superconducting transition. A map of the superconducting transition temperature ðT c Þ is generated from a series of VTSLM images. The map of T c indicates there are inhomogeneities in the film large enough to create nonunif...
متن کاملObservation of Vortex Lattice Related Anomalies in Polycrystalline YBa2Cu3O7-x Near the Superconducting Transition
The d.c. I-V characteristic of polycrystalline YBa2Cu3O7−x high temperature superconductors (HTSC) is measured near the transition temperature (Tc). The Tc was found to be 90 K with a width of 2 K. The voltage was measured at various current values and with reversing the current. A difference in voltage was found for forward and reverse current directions near Tc. The observed directionality of...
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ژورنال
عنوان ژورنال: Journal of Physics: Conference Series
سال: 2008
ISSN: 1742-6596
DOI: 10.1088/1742-6596/97/1/012237